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<title><![CDATA[Comentarios al libro: SCANNING MICROSCOPY FOR NANOTECHNOLOGY]]></title>
<link><![CDATA[https://biblioeteca.com/biblioeteca.web/titulo/scanning-microscopy-for-nanotechnology]]></link>
<description><![CDATA[This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.]]></description>
<lastBuildDate>Sun, 27 Sep 2026 20:35:02 +0000</lastBuildDate>
<language>es</language>
<copyright>Copyright 202 6BiblioEteca Technologies SL</copyright>

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